(OES): a technique used in the analysis of artifact composition, based on the principle that electrons, when excited (i.e. heated to a high temperature), release light of a particular wavelength. The presence or absence of various elements is established by examining the appropriate spectral line of their characteristic wavelengths. Generally, this method gives an accuracy of only 25 percent and has been superseded by ICPS (inductively coupled plasma emission spectrometry).
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